Un séminaire de l'Institut Fresnel

Stephan Hruszkewycz (Argonne National Laboratory, USA), actuellement chercheur invité à l'Institut Fresnel dans l'équipe SEMOX donne un séminaire intitulé "Visualizing lattice structure in thin films with new 2D and 3D Bragg ptychography approaches" le jeudi 5 février 2015 à 10h30 en salle Pierre Cotton (sous-sol du laboratoire).

X-ray ptychography implemented in the Bragg geometry combines the robustness of ptychographic imaging, the structural sensitivity of Bragg diffraction, and the ability of hard x-rays to nondestructively probe materials in realistic environments. Here, we will discuss the theory and application of our 2D Bragg Projection Ptychography approach in imaging strain fields in semiconductor and ferroelectric thin films. We will also introduce a new approach, 3D Bragg Projection Ptychography, that enables 3D imaging of materials structure using scanning probe coherent diffraction data measured at a single incident Bragg angle.

Contact : Stephan Hruszkewycz Assistant Physicist
Argonne National Laboratory Materials Science Department

Invitation : Virginie CHAMARD et Marc ALLAIN, équipe Sondage ElectroMagnétique, Optique et Rayons X (SEMOX)